荷兰代尔夫特理工大学Sjoerd Stallinga研究组取得进展。他们开发了具有噪声控制图像重建的结构照明显微镜。2021年6月14日出版的《自然-方法学》发表了这项成果。

他们提出了一个物理上真实的噪声模型，它解释了结构化噪声伪影，然后他们用它来激发新的互补重建方法。真维纳滤波超分辨率结构照明显微镜 (SIM)优化了可用信噪比的对比度，而平坦噪声 SIM 完全克服了结构化噪声伪影，同时保持了分辨率。这两种方法都消除了用户可调整的临时重建参数，以支持物理参数，从而增强了客观性。

新的重建指向对比度和自然噪声外观之间的权衡。这种折衷可以通过进一步的陷波滤波来部分克服，但代价是信噪比降低。所提出的方法的好处在二维和三维的粘着斑和微管蛋白样品以及纳米制造的荧光测试模式上得到了证明。

据介绍，SIM 已成为一种广泛使用的生物成像方法。然而，标准重建算法容易产生特定于噪声的伪影，这限制了它们对较低信噪比数据的适用性。

附：英文原文

Title: Structured illumination microscopy with noise-controlled image reconstructions

Author: Carlas S. Smith, Johan A. Slotman, Lothar Schermelleh, Nadya Chakrova, Sangeetha Hari, Yoram Vos, Cornelis W. Hagen, Marcel Mller, Wiggert van Cappellen, Adriaan B. Houtsmuller, Jacob P. Hoogenboom, Sjoerd Stallinga

Issue&Volume: 2021-06-14

Abstract: Super-resolution structured illumination microscopy (SIM) has become a widely used method for biological imaging. Standard reconstruction algorithms, however, are prone to generate noise-specific artifacts that limit their applicability for lower signal-to-noise data. Here we present a physically realistic noise model that explains the structured noise artifact, which we then use to motivate new complementary reconstruction approaches. True-Wiener-filtered SIM optimizes contrast given the available signal-to-noise ratio, and flat-noise SIM fully overcomes the structured noise artifact while maintaining resolving power. Both methods eliminate ad hoc user-adjustable reconstruction parameters in favor of physical parameters, enhancing objectivity. The new reconstructions point to a trade-off between contrast and a natural noise appearance. This trade-off can be partly overcome by further notch filtering but at the expense of a decrease in signal-to-noise ratio. The benefits of the proposed approaches are demonstrated on focal adhesion and tubulin samples in two and three dimensions, and on nanofabricated fluorescent test patterns. 

DOI: 10.1038/s41592-021-01167-7

Source: https://www.nature.com/articles/s41592-021-01167-7